| Records |
| Author |
Koshelets, V. P.; Khudchenko, A. V. |
Title  |
Analysis of spectral characteristics of a superconducting integrated receiver |
Type |
Journal Article |
| Year |
2006 |
Publication |
J. Communications Technol. Electron. |
Abbreviated Journal |
|
| Volume |
51 |
Issue |
5 |
Pages |
596-603 |
| Keywords |
|
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Summary Language |
|
Original Title |
|
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
|
ISBN |
|
Medium |
|
| Area |
|
Expedition |
|
Conference |
|
| Notes |
|
Approved |
no |
| Call Number |
RPLAB @ s @ mix_SIR |
Serial |
400 |
| Permanent link to this record |
| |
|
| |
| Author |
Koshelets, V. P.; Khudchenko, A. V. |
| Title |
Analysis of spectral characteristics of a superconducting integrated receiver |
Type |
Journal Article |
| Year |
2006 |
Publication |
J. Communications Technol. Electron. |
Abbreviated Journal |
|
| Volume |
51 |
Issue |
5 |
Pages |
596-603 |
| Keywords |
SIR |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Summary Language |
|
Original Title |
|
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
1064-2269 |
ISBN |
|
Medium |
|
| Area |
|
Expedition |
|
Conference |
|
| Notes |
|
Approved |
no |
| Call Number |
|
Serial |
526 |
| Permanent link to this record |
| |
|
| |
| Author |
|
| Title |
Atacama Pathfinder Experiment APEX |
Type |
|
| Year |
2006 |
Publication |
|
Abbreviated Journal |
|
| Volume |
|
Issue |
|
Pages |
|
| Keywords |
|
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Summary Language |
|
Original Title |
|
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
|
ISBN |
|
Medium |
|
| Area |
|
Expedition |
|
Conference |
|
| Notes |
|
Approved |
no |
| Call Number |
RPLAB @ s @ APEX_proj |
Serial |
396 |
| Permanent link to this record |
| |
|
| |
| Author |
Kenyon, M.; Day, P. K.; Bradford, C. M.; Bock, J. J.; Leduc, H. G. |
| Title |
Background-limited membrane-isolated TES bolometers for far-IR/submillimeter direct-detection spectroscopy |
Type |
Journal Article |
| Year |
2006 |
Publication |
Nucl. Instr. & Meth. Phys. Res. A |
Abbreviated Journal |
|
| Volume |
559 |
Issue |
|
Pages |
456-458 |
| Keywords |
|
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Summary Language |
|
Original Title |
|
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
|
ISBN |
|
Medium |
|
| Area |
|
Expedition |
|
Conference |
|
| Notes |
|
Approved |
no |
| Call Number |
RPLAB @ s @ TES_NEP_1e_19 |
Serial |
384 |
| Permanent link to this record |
| |
|
| |
| Author |
Gao, J. R.; Hajenius, M.; Tichelaar, F. D.; Voronov, B.; Grishina, E.; Klapwijk, T. M.; Gol'tsman, G.; Zorman, C. A. |
| Title |
Can NbN films on 3C-SiC/Si change the IF bandwidth of hot electron bolometer mixers? |
Type |
Conference Article |
| Year |
2006 |
Publication |
Proc. 17th Int. Symp. Space Terahertz Technol. |
Abbreviated Journal |
Proc. 17th Int. Symp. Space Terahertz Technol. |
| Volume |
|
Issue |
|
Pages |
187-189 |
| Keywords |
NbN HEB mixers |
| Abstract |
We realized ultra thin NbN films sputtered grown on a 3C-SiC/Si substrate. The film with a thickness of 3.5-4.5 nm shows a 1', of 11.8 K, which is the highest I`, observed among ultra thin NbN films on different substrates. The high-resolution transmission electron microscopy (HRTEM) studies show that the film has a monocrystalline structure, confirming the epitaxial growth on the 3C-SiC. Based on a two-temperature model and input parameters from standard NbN films on Si, simulations predict that the new film can increase the IF bandwidth of a HEB mixer by about a factor of 2 in comparison to the standard films. In addition, we find standard NbN films on Si with a T c of 9.4 K have a thickness of around 5.5 nm, being thicker than expected (3.5 nm). |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
|
Summary Language |
|
Original Title |
|
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
|
ISBN |
|
Medium |
|
| Area |
|
Expedition |
|
Conference |
|
| Notes |
|
Approved |
no |
| Call Number |
|
Serial |
1439 |
| Permanent link to this record |
