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Author Schwarz, Brent
Title Lidar: Mapping the world in 3D Type Journal Article
Year 2010 Publication Nature Photonics Abbreviated Journal Nat. Photon.
Volume 4 Issue (down) 7 Pages 429-430
Keywords LIDAR
Abstract A high-definition LIDAR system with a rotating sensor head containing 64 semiconductor lasers allows the efficient generation of 3D environment maps at unprecedented levels of detail.
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Call Number RPLAB @ gujma @ Serial 696
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Author Perseguers, S.; Lewenstein, M.; Acín, A.; Cirac, J. I.
Title Quantum random networks Type Journal Article
Year 2010 Publication Nature Physics Abbreviated Journal Nat. Phys.
Volume 6 Issue (down) 7 Pages 539-543
Keywords fromIPMRAS
Abstract Quantum mechanics offers new possibilities to process and transmit information. In recent years, algorithms and cryptographic protocols exploiting the superposition principle and the existence of entangled states have been designed. They should allow us to realize communication and computational tasks that outperform any classical strategy. Here we show that quantum mechanics also provides fresh perspectives in the field of random networks. Already the simplest model of a classical random graph changes markedly when extended to the quantum case, where we obtain a distinct behaviour of the critical probabilities at which different subgraphs appear. In particular, in a network of N nodes, any quantum subgraph can be generated by local operations and classical communication if the entanglement between pairs of nodes scales as N-2. This result also opens up new vistas in the domain of quantum networks and their applications.
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Call Number RPLAB @ gujma @ Serial 804
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Author Konstantatos, Gerasimos; Sargent, Edward H.
Title Nanostructured materials for photon detection Type Journal Article
Year 2010 Publication Nature Nanotechnology Abbreviated Journal Nat. Nanotech.
Volume 5 Issue (down) 6 Pages 391–400
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Abstract The detection of photons underpins imaging, spectroscopy, fibre-optic communications and time-gated distance measurements. Nanostructured materials are attractive for detection applications because they can be integrated with conventional silicon electronics and flexible, large-area substrates, and can be processed from the solution phase using established techniques such as spin casting, spray coating and layer-by-layer deposition. In addition, their performance has improved rapidly in recent years. Here we review progress in light sensing using nanostructured materials, focusing on solution-processed materials such as colloidal quantum dots and metal nanoparticles. These devices exhibit phenomena such as absorption of ultraviolet light, plasmonic enhancement of absorption, size-based spectral tuning, multiexciton generation, and charge carrier storage in surface and interface traps.
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Call Number RPLAB @ gujma @ Serial 684
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Author Bialczak, R. C.; Ansmann, M.; Hofheinz, M.; Lucero, E.; Neeley, M.; O'Connell, A. D.; Sank, D.; Wang, H.; Wenner, J.; Steffen, M.; Cleland, A. N.; Martinis, J. M.
Title Quantum process tomography of a universal entangling gate implemented with Josephson phase qubits Type Journal Article
Year 2010 Publication Nature Physics Abbreviated Journal Nat. Phys.
Volume 6 Issue (down) 6 Pages 409-413
Keywords fromIPMRAS
Abstract Quantum gates must perform reliably when operating on standard input basis states and on complex superpositions thereof. Experiments using superconducting qubits have validated truth tables for particular implementations of, for example, the controlled-NOT gate, but have not fully characterized gate operation for arbitrary superpositions of input states. Here we demonstrate the use of quantum process tomography (QPT) to fully characterize the performance of a universal entangling gate between two superconducting qubits. Process tomography permits complete gate analysis, but requires precise preparation of arbitrary input states, control over the subsequent qubit interaction and ideally simultaneous single-shot measurement of output states. In recent work, it has been proposed to use QPT to probe noise properties and time dynamics of qubit systems and to apply techniques from control theory to create scalable qubit benchmarking protocols. We use QPT to measure the fidelity and noise properties of an entangling gate. In addition to demonstrating a promising fidelity, our entangling gate has an on-to-off ratio of 300, a level of adjustable coupling that will become a requirement for future high-fidelity devices. This is the first solid-state demonstration of QPT in a two-qubit system, as QPT has previously been demonstrated only with single solid-state qubits.
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Call Number RPLAB @ gujma @ Serial 803
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Author Hoeffgen, S.K.; Kuhnhenn, J.; Weinand, U.
Title High radiation sensitivity of chiral long period gratings Type Journal Article
Year 2010 Publication IEEE Trans. Nucl. Sci. Abbreviated Journal
Volume 57 Issue (down) 5 Pages 2915 - 2922
Keywords chiral fiber gratings, chiral gratings, chiral LPG, from chiralphotonics
Abstract The radiation sensitivity of chiral long period gratings was investigated for the first time. After a Co-60 gamma dose of 100 kGy they show radiation-induced changes of their transmission dip wavelength of up to 10 nm, which is 100 to 1000 times higher than the radiation-induced wavelength shift of different fiber Bragg grating types. They can therefore be used as radiation sensors down to doses of 10 Gy or even below, but not for accurate dose measurements since the size of the wavelength shift after a certain dose still depends on the radiation dose rate. Chiral gratings made of eight single mode fiber types with differences of their radiation-induced attenuation of several orders of magnitude were investigated in order to look for a correlation between dip wavelength shift and fiber attenuation. However, the dip wavelength curves do not show exactly the same order as the fiber attenuation curves. A theory that can exactly predict all properties of the chiral gratings might enable us to specify from our results an optimized fiber for the production of gratings that can also be used for radiation dosimetry.
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Call Number Serial 848
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