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Edlmayr, V.; Harzer, T. P.; Hoffmann, R.; Kiener, D.; Scheu, C.; Mitterer, C. |
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Effects of thermal annealing on the microstructure of sputtered Al2O3 coatings |
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2011 |
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J. Vac. Sci. Technol. A |
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29 |
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4 |
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8 |
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Annealing |
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The morphology and microstructure of Al2O3 thin films deposited by pulsed direct current magnetron sputtering were studied in the as-grown state and after vacuum annealing at 1000 °C for 12 h using transmission electron microscopy. For the coating deposited under low ion bombardment conditions, the film consists of small γ- and/or δ-Al2O3 grains embedded in an amorphous matrix. The grain size at the region close to the interface to the substrate was much larger than that of the remaining layer. Growth of the γ-Al2O3 phase is promoted during annealing but no transformation to α-Al2O3 was detected. For high-energetic growth conditions, clear evidence for γ-Al2O3 formation was found in the upper part of the coating with grain size much larger than for low-energetic growth, but the film was predominately amorphous at the interface region. Annealing resulted in the transformation of γ-Al2O3 to α-Al2O3, while the mainly amorphous part crystallized to γ-Al2O3. |
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Annealing |
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RPLAB @ gujma @ |
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693 |
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Ozhegov, R. V.; Gorshkov, K. N.; Gol'tsman, G. N.; Kinev, N. V.; Koshelets, V. P. |
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The stability of a terahertz receiver based on a superconducting integrated receiver |
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2011 |
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Supercond. Sci. Technol. |
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Supercond. Sci. Technol. |
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24 |
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3 |
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035003 |
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SIS mixer, SIR, stability |
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We present the results of stability testing of a terahertz radiometer based on a superconducting receiver with a SIS tunnel junction as the mixer and a flux-flow oscillator as the local oscillator. In the continuum mode, the receiver with a noise temperature of 95 K at 510 GHz measured over the intermediate frequency (IF) passband of 4-8 GHz offered a noise equivalent temperature difference of 10 ± 1 mK at an integration time of 1 s. We offer a method to significantly increase the integration time without the use of complex measurement equipment. The receiver observed a strong signal over a final detection bandwidth of 4 GHz and offered an Allan time of 5 s. |
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705 |
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Флоря, И.Н.; Корнеева, Ю.П.; Корнеев, А.А.; Гольцман, Г.Н. |
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Сверхпроводниковый однофотонный детектор для среднего инфракрасного диапазона на основе узких параллельных полосок |
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2011 |
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Труды Московского физико-технического института |
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Труды МФТИ |
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3 |
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2 |
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14-17 |
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SSPD |
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Мы рассматриваем ультрабыстрый сверхпроводниковый однофотонный детектор (SSPD). SSPD представляет собой тонкопленочную наноструктуру — очень узкую и длинную полоску сверхпроводника, изогнутую в виде меандра, изготовленную из пленки NbN толщиной 4 нм, нанесенной на сапфировую подложку. SSPD хорошо сопрягается с оптоволокном и легко может быть интегрирован в полностью готовую для работы приемную систему. В стремлении продвинуться в средний ИК диапозон нам удалось разработать SSPD в виде параллельно соединенных полосок с шириной полоски всего 50 нм и сохранить при этом сверхпроводящие свойства. Эти детекторы показывают более чем на порядок большую чувствительность на длине волны 3;5 мкм, чем SSPD в виде меандра. Полученные результаты открывают путь к эффективным детекторам среднего ИК-диапазона, обладающим скоростью счета свыше 1 ГГц. |
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RPLAB @ gujma @ |
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706 |
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Пентин, И. В.; Смирнов, К. В.; Вахтомин, Ю. Б.; Смирнов, А. В.; Ожегов, Р. В.; Дивочий, А. В.; Гольцман, Г. Н. |
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Быстродействующий терагерцевый приемник и инфракрасный счетчик одиночных фотонов на эффекте разогрева электронов в сверхпроводниковых тонкопленочных наноструктурах |
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2011 |
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Труды МФТИ |
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Труды МФТИ |
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3 |
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2 |
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38-42 |
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SSPD, SNSPD, HEB |
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Представлены результаты создания приемных систем терагерцевого диапазона (0.3-70 ТГц), обладающих рекордным быстродействием (50 пс) и высокой чувствительностью (до 5x 10^(-14) Вт/Гц^(1/2)), а также однофотонных приемных систем ближнего инфракрасного диапазона с квантовой эффективностью 25 %, уровнем темнового счета 10-1c., максимальной скоростью счета ~ 100 МГц и временным разрешением до 50 пс. |
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707 |
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Shangina, E. L.; Smirnov, K. V.; Morozov, D. V.; Kovalyuk, V. V.; Goltsman, G. N.; Verevkin, A. A.; Toropov, A. I.; Mauskopf, P. |
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Concentration dependence of energy relaxation time in AlGaAs/GaAs heterojunctions: direct measurements |
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2011 |
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Semicond. Sci. Technol. |
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Semicond. Sci. Technol. |
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26 |
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2 |
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025013 |
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AlGaAs/GaAs heterojunctions |
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We present measurements of the energy relaxation time, τε, of electrons in a single heterojunction in a quasi-equilibrium state using microwave time-resolved spectroscopy at 4.2 K. We find the relaxation time has a power-law dependence on the carrier density of the two-dimensional electron gas, τε∝nγs with γ = 0.40 ± 0.02 for values of the carrier density, ns, from 1.6 × 1011 to 6.6 × 1011cm−2. The results are in good agreement with predictions taking into account the scattering of the carriers by both piezoelectric and deformation potential acoustic phonons. We compare these results with indirect measurements of the energy relaxation time from energy loss measurements involving Joule heating of the electron gas. |
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0268-1242 |
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1215 |
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