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| Author |
Lobanov, Y.; Tong, E.; Blundell, R.; Hedden, A.; Voronov, B.; Gol'tsman, G. |
| Title |
Large-signal frequency response of an HEB mixer: from 300 MHz to terahertz |
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Journal Article |
| Year |
2011 |
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IEEE Trans. Appl. Supercond. |
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21 |
Issue |
3 |
Pages |
628-631 |
| Keywords |
waveguide NbN HEB mixers |
| Abstract |
We present a study of the large signal frequency response of an HEB mixer over a wide frequency range. In our experiments, we have subjected the HEB mixer to incident electromagnetic radiation from 0.3 GHz to 1 THz. The mixer element is an NbN film deposited on crystalline quartz. The mixer chip is mounted in a waveguide cavity, coupled to free space with a diagonal horn. At microwave frequencies, electromagnetic radiation is applied through the coaxial bias port of the mixer block. At higher frequencies the input signal passes via the diagonal horn feed. At each frequency, the incident power is varied and a family of I-V curves is recorded. From the curves we identify 3 distinct regimes of operation of the mixer separated by the phonon relaxation frequency and the superconducting energy gap frequency observed at about 3 GHz and 660 GHz respectively. In this paper, we will present observed curves and discuss the results of our experiment. |
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RPLAB @ gujma @ |
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719 |
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| Author |
Lobanov, Y.V.; Tong, C.-Y.E.; Hedden, A.S.; Blundell, R.; Voronov, B.M.; Gol'tsman, G.N. |
| Title |
Direct measurement of the gain and noise bandwidths of HEB mixers |
Type |
Journal Article |
| Year |
2011 |
Publication |
IEEE Trans. Appl. Supercond. |
Abbreviated Journal |
IEEE Trans. Appl. Supercond. |
| Volume |
21 |
Issue |
3 |
Pages |
645-648 |
| Keywords |
waveguide NbN HEB mixers |
| Abstract |
The intermediate frequency (IF) bandwidth of a hot electron bolometer (HEB) mixer is an important parameter of the mixer, in that it helps to determine its suitability for a given application. With the availability of wideband low noise amplifiers, it is simple to measure the performance of an HEB mixer over a wide range of IF at a fixed LO frequency using the standard Y-factor method. This in-situ method allows us to measure both the gain and noise bandwidths simultaneously. We have also measured mixer output impedance with a vector network analyser. Intrinsic time constant has been extracted from the impedance data and compared to the mixer's bandwidths determined from receiver Y-factor measurement. |
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RPLAB @ gujma @ |
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720 |
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| Author |
Kawakami, A; Saito, S.; Hyodo, M. |
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Fabrication of nano-antennas for superconducting Infrared detectors |
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Journal Article |
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2011 |
Publication |
IEEE Trans. Appl. Supercond. |
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21 |
Issue |
3 |
Pages |
632-635 |
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optical antennas, NbN/MgO/NbN/TiN/Al HEB, dipole antennas, IR, infrared |
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To improve the response performance of superconducting infrared detectors, we have developed a fabrication process for nano-antennas. A nano-antenna consists of a dipole antenna, and a superconducting thin film strip placed in the antenna's center. By measuring the transition temperature of the superconducting strips, we confirmed that their superconductivity maintained a good condition after the nano-antenna fabrication process. We also evaluated nano-antenna characteristics using Fourier transform infrared spectroscopy. The evaluated antenna length and width were respectively set at around 2400 nm and 400 nm, and the antennas were placed at intervals of several micrometers around the area of 1 mm2 . In an evaluation of spectral transmission characteristics, clear absorption caused by antenna effects was observed at around 1400 cm-1. High polarization dependencies were also observed. |
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761 |
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Galeazzi, Massimiliano |
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Fundamental noise processes in TES devices |
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Journal Article |
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2011 |
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IEEE Trans. Appl. Supercond. |
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IEEE Trans. Appl. Supercond. |
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21 |
Issue |
3 |
Pages |
267-271 |
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TES, Johnson noise, phonon noise, excess noise, flux-flow noise, thermal fluctuation noise |
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Microcalorimeters and bolometers are noise-limited devices, therefore, a proper understanding of all noise sources is essential to predict and interpret their performance. In this paper, I review the fundamental noise processes contributing to Transition Edge Sensor (TES) microcalorimeters and bolometers and their effect on device performance. In particular, I will start with a simple, monolithic device model, moving to a more complex one involving discrete components, to finally move to today's more realistic, comprehensive model. In addition to the basic noise contribution (equilibrium Johnson noise and phonon noise), TES are significantly affected by extra noise, which is commonly referred to as excess noise. Different fundamental processes have been proposed and investigated to explain the origin of this excess noise, in particular near equilibrium non-linear Johnson noise, flux-flow noise, and internal thermal fluctuation noise. Experimental evidence shows that all three processes are real and contribute, at different levels, to the TES noise, although different processes become important at different regimes. It is therefore time to discard the term “excess noise” and consider these terms part of the “fundamental noise processes” instead. |
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Recommended by Klapwijk |
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914 |
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Miller, Aaron J.; Lita, Adriana E.; Calkins, Brice; Vayshenker, Igor; Gruber, Steven M.; Nam, Sae Woo |
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Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent |
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Journal Article |
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2011 |
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Optics Express |
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Opt. Express |
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19 |
Issue |
10 |
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9102-9110 |
| Keywords |
TES |
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We present a compact packaging technique for coupling light from a single-mode telecommunication fiber to cryogenic single-photon sensitive devices. Our single-photon detectors are superconducting transition-edge sensors (TESs) with a collection area only a factor of a few larger than the area of the fiber core which presents significant challenges to low-loss fiber-to-detector coupling. The coupling method presented here has low loss, cryogenic compatibility, easy and reproducible assembly and low component cost. The system efficiency of the packaged single-photon counting detectors is verified by the “triplet method†of power-source calibration along with the “multiple attenuator†method that produces a calibrated single-photon flux. These calibration techniques, when used in combination with through-wafer imaging and fiber back-reflection measurements, give us confidence that we have achieved coupling losses below 1 % for all devices packaged according to the self-alignment method presented in this paper. |
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RPLAB @ gujma @ |
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666 |
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