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Тархов, Михаил Александрович |
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Title |
Разработка сверхпроводниковых однофотонных детекторов с повышенной спектральной чувствительностью и быстродействием |
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2016 |
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М. НИЦ “Курчатовский институт” |
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1-103 |
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SSPD |
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123182, Россия, Москва, пл. Академика И. В. Курчатова, 1 |
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Ph.D. thesis |
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НИЦ "Курчатовский институт" |
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1064 |
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Author |
Тархов, Михаил Александрович |
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Title |
Разработка сверхпроводниковых однофотонных детекторов с повышенной спектральной чувствительностью и быстродействием. Автореферат |
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2016 |
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М. НИЦ “Курчатовский институт” |
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1-30 |
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no |
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1065 |
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Peltonen, J. T.; Peng, Z. H.; Korneeva, Yu. P.; Voronov, B. M.; Korneev, A. A.; Semenov, A. V.; Gol'tsman, G. N.; Tsai, J. S; Astafiev, Oleg |
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Title |
Coherent dynamics and decoherence in a superconducting weak link |
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Journal Article |
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2016 |
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Physic. Rev. B, |
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Physic. Rev. B, |
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94 |
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180508 |
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RPLAB @ akorneev @ |
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1123 |
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Author |
Voss, Chris; Raz, Tahl |
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Title |
Never split the difference: negotiating as if your life depended on it |
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2016 |
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business, negotiating, psychology, FBI |
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HarperCollins |
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978-0-06-240780-1 |
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pdf, epub, mp3 (audio book) -- 85 MB in total |
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1838 |
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Finkel, M.; Thierschmann, H. R.; Galatro, L.; Katan, A. J.; Thoen, D. J.; de Visser, P. J.; Spirito, M.; Klapwijk, T. M. |
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Title |
Branchline and directional THz coupler based on PECVD SiNx-technology |
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Conference Article |
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2016 |
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41st IRMMW-THz |
Abbreviated Journal |
41st IRMMW-THz |
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microstrip, fixtures, coplanar waveguides, couplers, standards, probes, dielectrics |
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A fabrication technology to realize THz microstrip lines and passive circuit components is developed and tested making use of a plasma-enhanced chemical vapor deposition grown silicon nitride (PECVD SiNx) dielectric membrane. We use 2 μm thick SiNx and 300 nm thick gold layers on sapphire substrates. We fabricate a set of structures for thru-reflect-line (TRL) calibration, with the reflection standard implemented as a short through the via. We find losses of 9.5 dB/mm at 300 GHz for a 50 Ohm line. For a branchline coupler we measure 2.5 dB insertion loss, 1 dB amplitude imbalance and 21 dB isolation. Good control over the THz lines parameters is proven by similar performance of a set of 5 structures. The directional couplers show -14 dB transmission to the coupled port, -24 dB to the isolated port and -25 dB in reflection. The SiNx membrane, used as a dielectric, is compatible with atomic force microscopy (AFM) cantilevers allowing the application of this technology to the development of a THz near-field microscope. |
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2162-2035 |
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978-1-4673-8485-8 |
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7758586 |
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1295 |
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