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Schroeder, E.; Mauskopf, P.; Pilyavsky, G.; Sinclair, A.; Smith, N.; Bryan, S.; Mani, H.; Morozov, D.; Berggren, K.; Zhu, D.; Smirnov, K.; Vakhtomin, Y. |
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Title |
On the measurement of intensity correlations from laboratory and astronomical sources with SPADs and SNSPDs |
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Conference Article |
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Year |
2016 |
Publication |
Proc. SPIE |
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Proc. SPIE |
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Volume |
9907 |
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Pages |
99070P (1 to 13) |
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Keywords |
SPAD, NbN SSPD applications, SNSPD |
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Abstract |
We describe the performance of detector modules containing silicon single photon avalanche photodiodes (SPADs) and superconducting nanowire single photon detectors (SNSPDs) to be used for intensity interferometry. The SPADs are mounted in fiber-coupled and free-space coupled packages. The SNSPDs are mounted in a small liquid helium cryostat coupled to single mode fiber optic cables which pass through a hermetic feed-through. The detectors are read out with microwave amplifiers and FPGA-based coincidence electronics. We present progress on measurements of intensity correlations from incoherent sources including gas-discharge lamps and stars with these detectors. From the measured laboratory performance of the correlation system, we estimate the sensitivity to intensity correlations from stars using commercial telescopes and larger existing research telescopes. |
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SPIE |
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Malbet, F.; Creech-Eakman, M.J.; Tuthill, P.G. |
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Optical and Infrared Interferometry and Imaging V |
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no |
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1809 |
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Author |
Shcheslavskiy, V.; Morozov, P.; Divochiy, A.; Vakhtomin, Y.; Smirnov, K.; Becker, W. |
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Title |
Erratum: “Ultrafast time measurements by time-correlated single photon counting coupled with superconducting single photon detector” [Rev. Sci. Instrum. 87, 053117 (2016)] |
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Miscellaneous |
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Year |
2016 |
Publication |
Rev. Sci. Instrum. |
Abbreviated Journal |
Rev. Sci. Instrum. |
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Volume |
87 |
Issue |
6 |
Pages |
069901 |
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Keywords |
SSPD, SNSPD, TCSPC, jitter |
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Abstract |
In the original paper1the Ref. 10 should be M. Sanzaro, N. Calandri, A. Ruggeri, C. Scarcella, G. Boso, M. Buttafava, and A. Tosi, Proc. SPIE9370, 93701T (2015). |
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Becker & Hickl GmbH, Nahmitzer Damm 30, Berlin 12277, Germany |
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0034-6748 |
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PMID:27370512 |
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1810 |
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Author |
Voss, Chris; Raz, Tahl |
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Title |
Never split the difference: negotiating as if your life depended on it |
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2016 |
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business, negotiating, psychology, FBI |
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HarperCollins |
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978-0-06-240780-1 |
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pdf, epub, mp3 (audio book) -- 85 MB in total |
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no |
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1838 |
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Finkel, M.; Thierschmann, H. R.; Galatro, L.; Katan, A. J.; Thoen, D. J.; de Visser, P. J.; Spirito, M.; Klapwijk, T. M. |
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Title |
Branchline and directional THz coupler based on PECVD SiNx-technology |
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Conference Article |
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2016 |
Publication |
41st IRMMW-THz |
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41st IRMMW-THz |
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microstrip, fixtures, coplanar waveguides, couplers, standards, probes, dielectrics |
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Abstract |
A fabrication technology to realize THz microstrip lines and passive circuit components is developed and tested making use of a plasma-enhanced chemical vapor deposition grown silicon nitride (PECVD SiNx) dielectric membrane. We use 2 μm thick SiNx and 300 nm thick gold layers on sapphire substrates. We fabricate a set of structures for thru-reflect-line (TRL) calibration, with the reflection standard implemented as a short through the via. We find losses of 9.5 dB/mm at 300 GHz for a 50 Ohm line. For a branchline coupler we measure 2.5 dB insertion loss, 1 dB amplitude imbalance and 21 dB isolation. Good control over the THz lines parameters is proven by similar performance of a set of 5 structures. The directional couplers show -14 dB transmission to the coupled port, -24 dB to the isolated port and -25 dB in reflection. The SiNx membrane, used as a dielectric, is compatible with atomic force microscopy (AFM) cantilevers allowing the application of this technology to the development of a THz near-field microscope. |
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2162-2035 |
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978-1-4673-8485-8 |
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7758586 |
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1295 |
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Столяров, А. В. |
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Title |
Программирование. Введение в профессию. Том 1. Азы программирования |
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Book Whole |
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2016 |
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МАКС Пресс |
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programming, computer science |
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Abstract |
Первый том серии «Программирование: введение в профессию» включает две основные части. В первую часть книги вошли избранные сведения из истории вычислительной техники, обсуждение некоторых областей математики, непосредственно используемых программистами (таких как алгебра логики, комбинаторика, позиционные системы счисления), математических основ программирования (теория вычислимости и теория алгоритмов), принципы построения и функционирования вычислительных систем, начальные сведения о работе с командной строкой ОС Unix. Вторая часть посвящена начальным навыкам составления компьютерных программ на примере Free Pascal под ОС Unix. Материал ориентирован на изучение в будущем языка Си, так что, в частности, много внимания уделено работе с адресами и указателями, построению списков и других динамических структур данных; в то же время многие возможности Паскаля из рассмотрения исключены. Даются сведения о правилах оформления текстов программ, о тестировании и отладке. |
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Москва |
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978-5-317-05222-5 |
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1133 |
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