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Elezov, M.; Ozhegov, R.; Goltsman, G.; Makarov, V. |
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Title |
Countermeasure against bright-light attack on superconducting nanowire single-photon detector in quantum key distribution |
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Journal Article |
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Year |
2019 |
Publication |
Opt. Express |
Abbreviated Journal |
Opt. Express |
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Volume |
27 |
Issue |
21 |
Pages |
30979-30988 |
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Keywords |
SSPD, SNSPD |
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Abstract  |
We present an active anti-latching system for superconducting nanowire single-photon detectors. We experimentally test it against a bright-light attack, previously used to compromise security of quantum key distribution. Although our system detects continuous blinding, the detector is shown to be partially blindable and controllable by specially tailored sequences of bright pulses. Improvements to the countermeasure are suggested. |
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1094-4087 |
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PMID:31684339 |
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1275 |
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Author |
Polyakova, M.; Semenov, A. V.; Kovalyuk, V.; Ferrari, S.; Pernice, W. H. P.; Gol'tsman, G. N. |
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Title |
Protocol of measuring hot-spot correlation length for SNSPDs with near-unity detection efficiency |
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Journal Article |
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Year |
2019 |
Publication |
IEEE Trans. Appl. Supercond. |
Abbreviated Journal |
IEEE Trans. Appl. Supercond. |
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Volume |
29 |
Issue |
5 |
Pages |
1-5 |
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Keywords |
SSPD, waveguide-integrated SNSPD, hot-spot interaction length |
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Abstract |
We present a simple quantum detector tomography protocol, which allows, without ambiguities, to measure the two-spot detection efficiency and extract the hot-spot interaction length of superconducting nanowire single photon detectors (SNSPDs) with unity intrinsic detection efficiency. We identify a significant parasitic contribution to the measured two-spot efficiency, related to an effect of the bias circuit, and find a way to rule out this contribution during data post-processing and directly in the experiment. From the data analysis for waveguide-integrated SNSPD, we find signatures of the saturation of the two-spot efficiency and hot-spot interaction length of order of 100 nm. |
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1051-8223 |
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1187 |
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Author |
Manova, N. N.; Smirnov, E. O.; Korneeva, Yu. P.; Korneev, A. A.; Goltsman, G. N. |
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Title |
Superconducting photon counter for nanophotonics applications |
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Conference Article |
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Year |
2019 |
Publication |
J. Phys.: Conf. Ser. |
Abbreviated Journal |
J. Phys.: Conf. Ser. |
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Volume |
1410 |
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Pages |
012147 (1 to 5) |
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Keywords |
SSPD, SNSPD |
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We develop large area superconducting single-photon detector SSPD with a micron-wide strip suitable for free-space coupling or packaging with multi-mode optical fibres. The detector sensitive area is 20 μm in diameter. In near infrared (1330 nm wavelength) our SSPD exhibits above 30% detection efficiency with low dark counts and 45 ps timing jitter. |
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1742-6588 |
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1271 |
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Author |
Elezov, M.; Scherbatenko, M.; Sych, D.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. |
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Title |
Towards the fiber-optic Kennedy quantum receiver |
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Conference Article |
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Year |
2019 |
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EPJ Web Conf. |
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EPJ Web Conf. |
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Volume |
220 |
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03011 (1 to 2) |
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Keywords |
SSPD, SNSPD, Kennedy quantum receiver |
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We consider practical aspects of using standard fiber-optic elements and superconducting nanowire single-photon detectors for the development of a practical quantum receiver based on the Kennedy scheme. Our receiver allows to discriminate two phase-modulated coherent states of light at a wavelength of 1.5 microns in continuous mode with bit rate 200 Kbit/s and error rate about two times below the standard quantum limit. |
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2100-014X |
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1288 |
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Saveskul, N. A.; Titova, N. A.; Baeva, E. M.; Semenov, A. V.; Lubenchenko, A. V.; Saha, S.; Reddy, H.; Bogdanov, S. I.; Marinero, E. E.; Shalaev, V. M.; Boltasseva, A.; Khrapai, V. S.; Kardakova, A. I.; Goltsman, G. N. |
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Title |
Superconductivity behavior in epitaxial TiN films points to surface magnetic disorder |
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Journal Article |
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Year |
2019 |
Publication |
Phys. Rev. Applied |
Abbreviated Journal |
Phys. Rev. Applied |
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Volume |
12 |
Issue |
5 |
Pages |
054001 |
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Keywords |
epitaxial TiN films |
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Abstract |
We analyze the evolution of the normal and superconducting properties of epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe an increase of the residual resistivity, that becomes dominated by diffusive surface scattering for d≤20nm. At the same time, a substantial thickness-dependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such high-quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of approximately 1012cm−2. Our results suggest that surface magnetic disorder is generally present in oxidized TiN films. |
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2331-7019 |
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1166 |
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