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Bondarenko, O. I., Gershenzon, E. M., Gurvich, Y. A., Orlova, S. L., & Ptitsina, N. G. (1972). Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields. Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников, 6, 362–363.
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Gershenzon, E. M., Gurvich, Y. A., Orlova, S. L., & Ptitsina, N. G. (1976). Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions. Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников, 10, 1379–1383.
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Verevkin, A., Gershenzon, E. M., Gol'tsman, G. N., Ptitsina, N. G., Chulkova, G. M., Smirnov, K. S., et al. (2002). Direct measurements of energy relaxation times in two-dimensional structures under quasi-equilibrium conditions. In Mater. Sci. Forum (Vol. 384-3, pp. 107–116).
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Karasik, B. S., Il'in, K. S., Ptitsina, N. G., Gol'tsman, G. N., Gershenzon, E. M., Pechen', E. V., et al. (1998). Electron-phonon scattering rate in impure NbC films. In NASA/ADS (Y35.08).
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Gershenzon, Y. M., Goltsman, G. N., Yelantyev, A. I., Petrova, Y. B., Ptitsina, N. G., & Filatov, V. S. (1987). Lecture demonstrations of properties of superconductors and liquid helium. USSR Rept Phys. Math. JPRS UPM, 24(7), 51.
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Goltsman, G. N., Maliavkin, A. V., Ptitsina, N. G., & Selevko, A. G. (1986). Magnetic exciton spectroscopy in uniaxially compressed Ge at submillimeter waves. In Izv. Akad. Nauk SSSR, Seriya Fizicheskaya (Vol. 50, pp. 280–281).
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Gershenzon, E. M., Goltsman, G. N., Multanovskii, V. V., & Ptitsina, N. G. (1982). Kinetics of submillimeter impurity and exciton photoconduction in Ge. Optics and Spectroscopy, 52(4), 454–455.
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Gershenzon, E., Goltsman, G., Orlov, L., & Ptitsina, N. (1978). Population of excited-states of small admixtures in germanium. In Izv. Akad. Nauk SSSR, Seriya Fizicheskaya (Vol. 42, pp. 1154–1159). Mezhdunarodnaya Kniga 39 Dimitrova Ul., 113095 Moscow, Russia.
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Gershenzon, E. M., Goltsman, G., Orlova, S., Ptitsina, N., & Gurvich, Y. (1971). Germanium hot-electron narrow-band detector. Sov. Radio Engineering And Electronic Physics, 16(8), 1346.
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Gershenson, E. M., Gol'tsman, G. N., Elant'ev, A. I., Kagane, M. L., Multanovskii, V. V., & Ptitsina, N. G. (1983). Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov. Phys. Semicond., 17(8), 908–913.
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