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Floet, D. W., Baselmans, J. J. A., Klapwijk, T. M., & Gao, J. R. (1998). Resistive transition of niobium superconducting hot-electron bolometer mixers. Appl. Phys. Lett., 73(19), 2826.
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Fu, K., Zannoni, R., Chan, C., Adams, S. H., Nicholson, J., Polizzi, E., et al. (2008). Terahertz detection in single wall carbon nanotubes. Appl. Phys. Lett., 92(3), 033105.
Abstract: It is reported that terahertz radiation from 0.69 to 2.54 THz has been sensitively detected in a device consisting of bundles of carbon nanotubes containing single wall metallic carbon nanotubes, quasioptically coupled through a lithographically fabricated antenna, and a silicon lens. The measured data are consistent with a bolometric detection process in the metallic tubes and the devices show promise for operation well above 4.2 K.
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Gao, J. R., Hajenius, M., Baselmans, J. J. A., Klapwijk, T. M., de Korte, P. A. J., Voronov, B., et al. (2004). NbN hot electron bolometer mixers with superior performance for space applications. In E. Armandillo, & B. Leone (Eds.), Proc. Int. workshop on low temp. electronics (pp. 11–17). Noordwijk.
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Gao, J. R., Hajenius, M., Baselmans, J. J. A., Yang, Z. Q., Baryshev, A. M., Barends, R., et al. (2005). Twin-slot antenna coupled NbN hot electron bolometer mixers for space applications. In Proc. 9-th WMSCI (Vol. 9, pp. 148–153). International Institute of Informatics and Systemics.
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Gao, J. R., Hajenius, M., Tichelaar, F. D., Voronov, B., Grishina, E., Klapwijk, T. M., et al. (2006). Can NbN films on 3C-SiC/Si change the IF bandwidth of hot electron bolometer mixers? In Proc. 17th Int. Symp. Space Terahertz Technol. (pp. 187–189).
Abstract: We realized ultra thin NbN films sputtered grown on a 3C-SiC/Si substrate. The film with a thickness of 3.5-4.5 nm shows a 1', of 11.8 K, which is the highest I`, observed among ultra thin NbN films on different substrates. The high-resolution transmission electron microscopy (HRTEM) studies show that the film has a monocrystalline structure, confirming the epitaxial growth on the 3C-SiC. Based on a two-temperature model and input parameters from standard NbN films on Si, simulations predict that the new film can increase the IF bandwidth of a HEB mixer by about a factor of 2 in comparison to the standard films. In addition, we find standard NbN films on Si with a T c of 9.4 K have a thickness of around 5.5 nm, being thicker than expected (3.5 nm).
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