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Loudkov, D., Tong, C. - Y. E., Blundell, R., Kaurova, N., Grishina, E., Voronov, B., et al. (2005). An investigation of the performance of the waveguide superconducting HEB mixer at different RF embedding impedances. In Proc. 16th Int. Symp. Space Terahertz Technol. (pp. 226–229).
Abstract: We have conducted an investigation of the performance of superconducting hot-electron bolometric (HEB) mixer at 800 GHz as a function of the embedding impedance of the waveguide embedding circuit. Using a single half-height mixer block, we have developed three different mixer chip configurations, offering nominal embedding resistances of 70, 35, and 15 Ohms. Both the High Frequency Structure Simulator (HFSS) software and scaled model impedance measurements were employed in the design process. Two batches of HEB mixers were fabricated to these designs using 3-4 nm thick NbN thin film. The mixers were characterized through receiver noise temperature measurements and Fourier Transform Spectrometer (FTS) scans. Briefly, a minimum receiver noise temperature of 440 K was measured at a local oscillator frequency 850 GHz for a mixer of normal state resistance 62 Ohms incorporated into a circuit offering a nominal embedding impedance of 70 Ohms. We conclude from our data that, for low noise operation, the normal state resistance of the HEB mixer element should be close to that of the embedding impedance of the mixer mount.
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Kawano, Y., & Ishibashi, K. (2008). An on-chip near-field terahertz probe and detector. Nature Photon, 2(10), 618–621.
Abstract: The advantageous properties of terahertz waves, such as their transmission through objects opaque to visible light, are attracting attention for imaging applications. A promising approach for achieving high spatial resolution is the use of near-field imaging. Although this method has been well established in the visible and microwave regions, it is challenging to perform in the terahertz region. In the terahertz techniques investigated to date, detectors have been located remotely from the probe, which degrades sensitivity, and the influence of far-field waves is unavoidable. Here we present a new integrated detection device for terahertz near-field imaging in which all the necessary detection components — an aperture, a probe and a terahertz detector — are integrated on one semiconductor chip, which is cryogenically cooled. This scheme allows highly sensitive, high-resolution detection of the evanescent field alone and promises new capabilities for high-resolution terahertz imaging.
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Inderbitzin, K., Engel, A., Schilling, A., Il'in, K., & Siegel, M. (2012). An ultra-fast superconducting Nb nanowire single-photon detector for soft x-rays. Appl. Phys. Lett., 101.
Abstract: Although superconducting nanowire single-photon detectors (SNSPDs) are well studied regarding the
detection of infrared/optical photons and keV-molecules, no studies on continuous x-ray photon
counting by thick-film detectors have been reported so far. We fabricated a 100 nm thick niobium
x-ray SNSPD (an X-SNSPD) and studied its detection capability of photons with keV-energies in
continuous mode. The detector is capable to detect photons even at reduced bias currents of 0.4%,
which is in sharp contrast to optical thin-film SNSPDs. No dark counts were recorded in extended
measurement periods. Strikingly, the signal amplitude distribution depends significantly on the photon
energy spectrum.VC
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Lipatov, A., Okunev, O., Smirnov, K., Chulkova, G., Korneev, A., Kouminov, P., et al. (2002). An ultrafast NbN hot-electron single-photon detector for electronic applications. Supercond. Sci. Technol., 15(12), 1689–1692.
Abstract: We present the latest generation of our superconducting single-photon detector (SPD), which can work from ultraviolet to mid-infrared optical radiation wavelengths. The detector combines a high speed of operation and low jitter with high quantum efficiency (QE) and very low dark count level. The technology enhancement allows us to produce ultrathin (3.5 nm thick) structures that demonstrate QE hundreds of times better, at 1.55 μm, than previous 10 nm thick SPDs. The best, 10 × 10 μm2, SPDs demonstrate QE up to 5% at 1.55 μm and up to 11% at 0.86 μm. The intrinsic detector QE, normalized to the film absorption coefficient, reaches 100% at bias currents above 0.9 Ic for photons with wavelengths shorter than 1.3 μm.
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David Olaya, Jian Wei, Sergei Pereverzev, Karasik, B. S., Kawamura, Jhan H., McGrath, W. R., et al. (2006). An ultrasensitive hot-electron bolometer for low-background SMM applications. In Proc. SPIE (Vol. 6275, 627506).
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