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Hong, K., Marsh, P. F., Geok-Ing Ng, Pavlidis, D., & Hong, C. - H. (1994). Optimization of MOVPE grown InxAl1-xAs/In0.53Ga0.47As planar heteroepitaxial Schottky diodes for terahertz applications. IEEE Trans. Electron Devices, 41(9), 1489–1497.
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Gershenzon, E. M., Gol'tsman, G. N., Zorin, M. A., Karasik, B. S., & Trifonov, V. A. (1994). Nonequilibrium and bolometric response of YBaCuO films in a resistive state to infrared low intensity radiation. In Council on Low-temp. Phys. (pp. 82–83).
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Elantev, A. I., & Karasik, B. S. (1994). Noise temperature of a superconducting hot-electron mixer. In Proc. 5th Int. Symp. Space Terahertz Technol. (225).
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Voronov, B. M., Gershenzon, E. M., Gol'tsman, G. N., Gubkina, T. O., & Semash, V. D. (1994). Superconductive properties of ultrathin NbN films on different substrates. Sverkhprovodimost': Fizika, Khimiya, Tekhnika, 7(6), 1097–1102.
Abstract: A study was made on dependence of surface resistance, critical temperature and width of superconducting transition on application temperature and thickness of NbN films, which varied within the range of 3-10 nm. Plates of sapphire, fused and monocrystalline quartz, MgO, as well as Si and silicon oxide were used as substrates. NbN films with 160 μθ·cm specific resistance and 16.5 K (Tc) critical temperature were obtained on sapphire substrates. Intensive growth of ΔTc was noted for films, applied on fused quartz, with increase of precipitation temperature. This is explained by occurrence of high tensile stresses in NbN films, caused by sufficient difference of thermal coefficients of expansion of NbN and quartz.
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Karasik, B. S., Milostnaya, I. I., Zorin, M. A., Elantev, A. I., Gol'tsman, G. N., & Gershenzon, E. M. (1994). Subnanosecond S-N and N-S switching of YBCO film induced by current pulse. Phys. C: Supercond., 235-240, 1981–1982.
Abstract: A transition of YBCO bridge 60 nm thick from superconducting to normal state induced by an abrupt current step has been studied. A subnanosecond stage has been observed during both S-N and N-S transition. The data obtained can be explained by hot-electron phenomena. On the basis of experimental results a prediction of picosecond switch performance has been made.
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