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Gundlach, K. H., & Schicke, M. (2000). SIS and bolometer mixers for terahertz frequencies. Supercond. Sci. Technol, 13, 181–187.
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Tong, C. - Y. E., Kawamura, J., Todd, R. H., Papa, D. C., Blundell, R., Smith, M., et al. (2000). Successful operation of a 1 THz NbN hot-electron bolometer receiver. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 49–59).
Abstract: A phonon-cooled NbN superconductive hot-electron bolometer receiver covering the frequency range 0.8-1.04 THz has successfully been used for astronomical observation at the Sub-Millimeter Telescope Observatory on Mount Graham, Arizona. This waveguide heterodyne receiver is a modified version of our fixed-tuned 800 GHz HEB receiver to allow for operation beyond 1 THz. The measured noise temperature of this receiver is about 1250 K at 0.81 THz, 560 K at 0.84 THz, and 1600 K at 1.035 THz. It has a 1 GHz wide IF bandwidth, centered at 1.8 GHz. This receiver has recently been used to detect the CO (9-8) molecular line emission at 1.037 THz in the Orion nebula. This is the first time a ground-based heterodyne receiver has been used to detect a celestial source above 1 THz.
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Semenov, A. D., Hübers, H. –W., Schubert, J., Gol'tsman, G. N., Elantiev, A. I., Voronov, B. M., et al. (2000). Frequency dependent noise temperature of the lattice cooled hot-electron terahertz mixer. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 39–48).
Abstract: We present the measurements and the theoretical model on the frequency dependent noise temperature of a lattice cooled hot electron bolometer (HEB) mixer in the terahertz frequency range. The experimentally observed increase of the noise temperature with frequency is a cumulative effect of the non-uniform distribution of the high frequency current in the bolometer and the charge imbalance, which occurs near the edges of the normal domain and contacts with normal metal. In addition, we present experimental results which show that the noise temperature of a HEB mixer can be reduced by about 30% due to a Parylene antireflection coating on the Silicon hyperhemispheric lens.
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Semenov, A. D., Hübers, H. - W., Schubert, J., Gol'tsman, G. N., Elantiev, A. I., Voronov, B. M., et al. (2000). Design and performance of the lattice-cooled hot-electron terahertz mixer. J. Appl. Phys., 88(11), 6758–6767.
Abstract: We present the measurements and the theoreticalmodel of the frequency-dependent noise temperature of a superconductor lattice-cooled hot-electron bolometer mixer in the terahertz frequency range. The increase of the noise temperature with frequency is a cumulative effect of the nonuniform distribution of the high-frequency current in the bolometer and the charge imbalance, which occurs at the edges of the normal domain and at the contacts with normal metal. We show that under optimal operation the fluctuation sensitivity of the mixer is determined by thermodynamic fluctuations of the noise power, whereas at small biases there appears additional noise, which is probably due to the flux flow. We propose the prescription of how to minimize the influence of the current distribution on the mixer performance.
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Sergeev, A., & Mitin, V. (2000). Electron-phonon interaction in disordered conductors: Static and vibrating scattering potentials. Phys. Rev. B., 61(9), 6041–6047.
Abstract: Employing the Keldysh diagram technique, we calculate the electron-phonon energy relaxation rate in a conductor with the vibrating and static δ-correlated random electron-scattering potentials. If the scattering potential is completely dragged by phonons, this model yields the Schmid’s result for the inelastic electron-scattering rate τ−1e−ph. At low temperatures the effective interaction decreases due to disorder, and τ−1e−ph∝T4l (l is the electron mean-free path). In the presense of the static potential, quantum interference of numerous scattering processes drastically changes the effective electron-phonon interaction. In particular, at low temperatures the interaction increases, and τ−1e−ph∝T2/l. Along with an enhancement of the interaction, which is observed in disordered metallic films and semiconducting structures at low temperatures, the suggested model allows us to explain the strong sensitivity of the electron relaxation rate to the microscopic quality of a particular film.
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