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Тархов, М. А. (2016). Разработка сверхпроводниковых однофотонных детекторов с повышенной спектральной чувствительностью и быстродействием. Ph.D. thesis, НИЦ "Курчатовский институт", .
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Тархов, М. А. (2016). Разработка сверхпроводниковых однофотонных детекторов с повышенной спектральной чувствительностью и быстродействием. Автореферат.
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Peltonen, J. T., Peng, Z. H., Korneeva, Y. P., Voronov, B. M., Korneev, A. A., Semenov, A. V., et al. (2016). Coherent dynamics and decoherence in a superconducting weak link. Physic. Rev. B,, 94, 180508.
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Voss, C., & Raz, T. (2016). Never split the difference: negotiating as if your life depended on it. HarperCollins.
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Finkel, M., Thierschmann, H. R., Galatro, L., Katan, A. J., Thoen, D. J., de Visser, P. J., et al. (2016). Branchline and directional THz coupler based on PECVD SiNx-technology. In 41st IRMMW-THz.
Abstract: A fabrication technology to realize THz microstrip lines and passive circuit components is developed and tested making use of a plasma-enhanced chemical vapor deposition grown silicon nitride (PECVD SiNx) dielectric membrane. We use 2 μm thick SiNx and 300 nm thick gold layers on sapphire substrates. We fabricate a set of structures for thru-reflect-line (TRL) calibration, with the reflection standard implemented as a short through the via. We find losses of 9.5 dB/mm at 300 GHz for a 50 Ohm line. For a branchline coupler we measure 2.5 dB insertion loss, 1 dB amplitude imbalance and 21 dB isolation. Good control over the THz lines parameters is proven by similar performance of a set of 5 structures. The directional couplers show -14 dB transmission to the coupled port, -24 dB to the isolated port and -25 dB in reflection. The SiNx membrane, used as a dielectric, is compatible with atomic force microscopy (AFM) cantilevers allowing the application of this technology to the development of a THz near-field microscope.
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