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Smirnov, K. V.; Divochiy, A. V.; Vakhtomin, Y. B.; Sidorova, M. V.; Karpova, U. V.; Morozov, P. V.; Seleznev, V. A.; Zotova, A. N.; Vodolazov, D. Y. Rise time of voltage pulses in NbN superconducting single photon detectors 2016 Appl. Phys. Lett. details   doi
Karasik, B. S.; Elantiev, A. I. Noise temperature limit of a superconducting hot-electron bolometer mixer 1996 Applied Physics Letters details   doi
Karasik, B. S.; Il'in, K. S.; Pechen, E. V.; Krasnosvobodtsev, S. I. Diffusion cooling mechanism in a hot-electron NbC microbolometer mixer 1996 Applied Physics Letters details   doi
Maslennikov, S. RF heating efficiency of the terahertz superconducting hot-electron bolometer 2014 arXiv details   url
Dube, I.; Jiménez, D.; Fedorov, G.; Boyd, A.; Gayduchenko, I.; Paranjape, M.; Barbara, P. Understanding the electrical response and sensing mechanism of carbon-nanotube-based gas sensors 2015 Carbon details   doi
Chulcova, G. M.; Ptitsina, N. G.; Gershenzon, E. M.; Gershenzon, M. E.; Sergeev, A. V. Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films 1996 Czech J. Phys. details   doi
Eletskii, A. V.; Sarychev, A. K.; Boginskaya, I. A.; Bocharov, G. S.; Gaiduchenko, I. A.; Egin, M. S.; Ivanov, A. V.; Kurochkin, I. N.; Ryzhikov, I. A.; Fedorov, G. E. Amplification of a Raman scattering signal by carbon nanotubes 2018 Dokl. Phys. details   doi
Lobanov, Y. V.; Vakhtomin, Y. B.; Pentin, I. V.; Khabibullin, R. A.; Shchavruk, N. V.; Smirnov, K. V.; Silaev, A. A. Characterization of the THz quantum cascade laser using fast superconducting hot electron bolometer 2018 EPJ Web Conf. details   doi
Tong, C.-Y.E.; Meledin, D.V.; Marrone, D.P.; Paine, S.N.; Gibson, H.; Blundell, R. Near field vector beam measurements at 1 THz 2003 IEEE Microw. Compon. Lett. details   doi
Smirnov, K.; Moshkova, M.; Antipov, A.; Morozov, P.; Vakhtomin, Y. The cascade switching of the photon number resolving superconducting single-photon detectors 2021 IEEE Trans. Appl. Supercond. details   doi
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