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Kitaeva, G. K.; Kornienko, V. V.; Kuznetsov, K. A.; Pentin, I. V.; Smirnov, K. V.; Vakhtomin, Y. B. Direct detection of the idler THz radiation generated by spontaneous parametric down-conversion 2019 Opt. Lett. details   doi
Elant'ev, A. I.; Karasik, B. S. Effect of high-frequency current on Nb superconductive film in resistive state 1989 Sov. J. Low Temp. Phys. details   openurl
Chulcova, G. M.; Ptitsina, N. G.; Gershenzon, E. M.; Gershenzon, M. E.; Sergeev, A. V. Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films 1996 Czech J. Phys. details   doi
Romanov, N. R.; Zolotov, P. I.; Vakhtomin, Y. B.; Divochiy, A. V.; Smirnov, K. V. Electron diffusivity measurements of VN superconducting single-photon detectors 2018 J. Phys.: Conf. Ser. details   doi
Sergeev, A.; Mitin, V. Electron-phonon interaction in disordered conductors: Static and vibrating scattering potentials 2000 Phys. Rev. B. details   doi
Ptitsina, N. G.; Chulkova, G. M.; Il’in, K. S.; Sergeev, A. V.; Pochinkov, F. S.; Gershenzon, E. M.; Gershenson, M. E. Electron-phonon interaction in disordered metal films: The resistivity and electron dephasing rate 1997 Phys. Rev. B details   doi
Yang, Y.; Fedorov, G.; Shafranjuk, S. E.; Klapwijk, T. M.; Cooper, B. K.; Lewis, R. M.; Lobb, C. J.; Barbara, P. Electronic transport and possible superconductivity at Van Hove singularities in carbon nanotubes 2015 Nano Lett. details   doi
Sergeev, A.; Karasik, B. S.; Ptitsina, N. G.; Chulkova, G. M.; Il'in, K. S.; Gershenzon, E. M. Electron–phonon interaction in disordered conductors 1999 Phys. Rev. B Condens. Matter details   doi
Klapwijk, T. M.; Semenov, A. V. Engineering physics of superconducting hot-electron bolometer mixers 2017 IEEE Trans. THz Sci. Technol. details   doi
Shcheslavskiy, V.; Morozov, P.; Divochiy, A.; Vakhtomin, Y.; Smirnov, K.; Becker, W. Erratum: “Ultrafast time measurements by time-correlated single photon counting coupled with superconducting single photon detector” [Rev. Sci. Instrum. 87, 053117 (2016)] 2016 Rev. Sci. Instrum. details   doi
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