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Kovalyuk, V.; Kahl, O.; Ferrari, S.; Vetter, A.; Lewes-Malandrakis, G.; Nebel, C.; Korneev, A.; Goltsman, G.; Pernice, W. On-chip single-photon spectrometer for visible and infrared wavelength range 2018 J. Phys.: Conf. Ser. 1124 051045 details   doi
Romanov, N. R.; Zolotov, P. I.; Vakhtomin, Y. B.; Divochiy, A. V.; Smirnov, K. V. Electron diffusivity measurements of VN superconducting single-photon detectors 2018 J. Phys.: Conf. Ser. 1124 051032 details   doi
Zolotov, P. I.; Divochiy, A. V.; Vakhtomin, Y. B.; Lubenchenko, A. V.; Morozov, P. V.; Shurkaeva, I. V.; Smirnov, K. V. Influence of sputtering parameters on the main characteristics of ultra-thin vanadium nitride films 2018 J. Phys.: Conf. Ser. 1124 051030 details   doi
Smirnov, E.; Golikov, A.; Zolotov, P.; Kovalyuk, V.; Lobino, M.; Voronov, B.; Korneev, A.; Goltsman, G. Superconducting nanowire single-photon detector on lithium niobate 2018 J. Phys.: Conf. Ser. 1124 051025 details   doi
Elezov, M. S.; Scherbatenko, M. L.; Sych, D. V.; Goltsman, G. N. Active and passive phase stabilization for the all-fiber Michelson interferometer 2018 J. Phys.: Conf. Ser. 1124 051014 (1 to 5) details   doi
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