List View
 |   | 
   web
Author (up) Title Year Publication Volume Pages
Gerecht, E.; Musante, C. F.; Schuch, R.; Lutz, C. R.; Jr.; Yngvesson, K. S.; Mueller, E. R.; Waldivian, J.; Gol'tsman, G. N.; Voronov, B. M.; Gershenzon, E. M. Hot electron detection and mixing experiments in NbN at 119 micrometer wavelength 1995 Proc. 6th Int. Symp. Space Terahertz Technol. 284-293
Gerecht, E.; Musante, C. F.; Wang, Z.; Yngvesson, K. S.; Mueller, E. R.; Waldman, J.; Gol'tsman, G. N.; Voronov, B. M.; Cherednichenco, S. I.; Svechnikov, S. I.; Yagoubov, P. A.; Gershenzon, E. M. Optimization of hot eleciron bolometer mixing efficiency in NbN at 119 micrometer wavelength 1996 Proc. 7th Int. Symp. Space Terahertz Technol. 584-600
Gerecht, E.; Musante, C. F.; Wang, Z.; Yngvesson, K. S.; Waldman, J.; Gol'tsman, G. N.; Yagoubov, P. A.; Svechnikov, S. I.; Voronov, B. M.; Cherednichenko, S. I.; Gershenzon, E. M. NbN hot electron bolometric mixer for 2.5 THz: the phonon cooled version 1997 Proc. 8th Int. Symp. Space Terahertz Technol. 258-271
Gerecht, E.; Musante, C. F.; Yngvesson, K. S.; Waldman, J.; Gol'tsman, G. N.; Yagoubov, P. A.; Voronov, B. M.; Gershenzon, E. M. Optical coupling and conversion gain for NbN HEB mixer at THz frequencies 1997 Proc. 4-th Int. Semicond. Device Research Symp. 47-50
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors 1983 Sov. Phys. Semicond. 17 908-913