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Author |
Title |
Year  |
Publication |
Volume |
Pages |
Links |
|
|
Blagosklonskaya, L. E.; Gershenzon, E. M.; Gol'tsman, G. N.; Elant'ev, A. I. |
Effect of a high magnetic field on the spectrum of donors in InSb |
1977 |
Fizika i Tekhnika Poluprovodnikov |
11 |
2373-2375 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Kagane, M. L. |
Observation of free carrier resonances in p-type germanium at submillimeter wavelengths |
1978 |
Sov. Phys. Solid State |
20 |
573-579 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G. |
Population and lifetime of excited states of shallow impurities in Ge |
1979 |
Sov. Phys. JETP |
49 |
355-362 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Multanovskii, V. V.; Ptitsyna, N. G. |
Capture of photoexcited carriers by shallow impurity centers in germanium |
1979 |
Sov. Phys. JETP |
50 |
728-734 |
|
|
|
Gershenzon, E.; Gershenzon, M. E.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Heating of quasiparticles in a superconducting film in the resistive state |
1981 |
JETP Lett. |
34 |
268-271 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Multanovskii, V. V.; Ptitsina, N. G. |
Cross section for binding of free carriers into excitons in germanium |
1981 |
JETP Lett. |
33 |
574 |
|
|
|
Gershenzon, E. M.; Gershenzon, M. E.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Nonselective effect of electromagnetic radiation on a superconducting film in the resistive state |
1982 |
JETP Lett. |
36 |
296-299 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Multanovskii, V. V.; Ptitsina, N. G. |
Kinetics of electron and hole binding into excitons in germanium |
1983 |
Sov. Phys. JETP |
57 |
369-376 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Semenov, A. D. |
Submillimeter backward wave tube spectrometer for measuring superconducting film transmission |
1983 |
Pribory i Tekhnika Eksperimenta |
26 |
134-137 |
|
|
|
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. |
Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors |
1983 |
Sov. Phys. Semicond. |
17 |
908-913 |
|
