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Finkel, M.; Thierschmann, H.; Galatro, L.; Katan, A. J.; Thoen, D. J.; de Visser, P. J.; Spirito, M.; Klapwijk, T. M. Performance of THz components based on microstrip PECVD SiNx technology 2017 IEEE Trans. THz Sci. Technol. 7 765-771 details   doi
Kardakova, A. I.; Coumou, P. C. J. J.; Finkel, M. I.; Morozov, D. V.; An, P. P.; Goltsman, G. N.; Klapwijk, T. M. Electron–phonon energy relaxation time in thin strongly disordered titanium nitride films 2015 IEEE Trans. Appl. Supercond. 25 1-4 details   doi
Hajenius, M.; Yang, Z. Q.; Gao, J. R.; Baselmans, J. J. A.; Klapwijk, T. M.; Voronov, B.; Gol'tsman, G. Optimized sensitivity of NbN hot electron bolometer mixers by annealing 2007 IEEE Trans. Appl. Supercond. 17 399-402 details   doi
Gao, J. R.; Hajenius, M.; Tichelaar, F. D.; Klapwijk, T. M.; Voronov, B.; Grishin, E.; Gol’tsman, G.; Zorman, C. A.; Mehregany, M. Monocrystalline NbN nanofilms on a 3C-SiC∕Si substrate 2007 Appl. Phys. Lett. 91 062504 (1 to 3) details   doi
Kooi, J. W.; Baselmans, J. J. A.; Baryshev, A.; Schieder, R.; Hajenius, M.; Gao, J.R.; Klapwijk, T. M.; Voronov, B.; Gol’tsman, G. Stability of heterodyne terahertz receivers 2006 J. Appl. Phys. 100 064904 (1 to 9) details   doi
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