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Author Title Year (up) Publication Volume Pages
Somani, S.; Kasapi, S.; Wilsher, K.; Lo, W.; Sobolewski, R.; Gol’tsman, G. New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect 2001 J. Vac. Sci. Technol. B 19 2766-2769
Sobolewski, R.; Verevkin, A.; Gol'tsman, G.N.; Lipatov, A.; Wilsher, K. Ultrafast superconducting single-photon optical detectors and their applications 2003 IEEE Trans. Appl. Supercond. 13 1151-1157
Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Wilsher, K.; Lo, W.; Okunev, O.; Korneev, A.; Kouminov, P.; Chulkova, G.; Gol’tsman, G. N. A superconducting single-photon detector for CMOS IC probing 2003 Proc. 16-th LEOS 2 602-603
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors 2003 Electron. Lett. 39 1086-1088
Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Okunev, O.; Korneev, A.; Kouminov, P.; Smirnov, K.; Chulkova, G.; Gol’tsman, G. N.; Lo, W.; Wilsher, K. Infrared picosecond superconducting single-photon detectors for CMOS circuit testing 2003 CLEO/QELS Cmv4