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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358 details   doi
Marksteiner, M.; Divochiy, A.; Sclafani, M.; Haslinger, P.; Ulbricht, H.; Korneev, A.; Semenov, A.; Gol'tsman, G.; Arndt, M. A superconducting NbN detector for neutral nanoparticles 2009 Nanotechnol. 20 455501 details   doi
Marsili, F.; Bitauld, D.; Divochiy, A.; Gaggero, A.; Leoni, R.; Mattioli, F.; Korneev, A.; Seleznev, V.; Kaurova, N.; Minaeva, O.; Gol’tsman, G.; Lagoudakis, K.G.; Benkahoul, M.; Lévy, F.; Fiore, A. Superconducting nanowire photon number resolving detector at telecom wavelength 2008 CLEO/QELS Qmj1 (1 to 2) details   url
Marsili, F.; Bitauld, D.; Fiore, A.; Gaggero, A.; Leoni, R.; Mattioli, F.; Divochiy, A.; Korneev, A.; Seleznev, V.; Kaurova, N.; Minaeva, O.; Goltsman, G. Superconducting parallel nanowire detector with photon number resolving functionality 2009 J. Modern Opt. 56 334-344 details   doi
Marsili, Francesco; Bitauld, David; Fiore, Andrea; Gaggero, Alessandro; Mattioli, Francesco; Leoni, Roberto; Divochiy, Aleksander; Gol'tsman, Gregory Photon-number-resolution at telecom wavelength with superconducting nanowires 2010 IntechOpen details   doi
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