| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Smirnov, K. V.; Vakhtomin, Yu. B.; Divochiy, A. V.; Ozhegov, R. V.; Pentin, I. V.; Slivinskaya, E. V.; Tarkhov, M. A.; Gol’tsman, G. N. |
Single-photon detectors for the visible and infrared parts of the spectrum based on NbN nanostructures |
2009 |
Proc. Progress In Electromagnetics Research Symp. |
|
863-864 |
| McCarthy, Aongus; Krichel, Nils J.; Gemmell, Nathan R.; Ren, Ximing; Tanner, Michael G.; Dorenbos, Sander N.; Zwiller, Val; Hadfield, Robert H.; Buller, Gerald S. |
Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection |
2013 |
Opt. Express |
21 |
8904-8915 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
|
2 |
| Marsili, F.; Verma, V. B.; Stern, J. A.; Harrington, S.; Lita, A. E.; Gerrits, T.; Vayshenker, I.; Baek, B.; Shaw, M. D.; Mirin, R. P.; Nam, S. W. |
Detecting single infrared photons with 93% system efficiency |
2013 |
Nat. Photon. |
7 |
210-214 |
