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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links  |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
|
|
Seki, T.; Shibata, H.; Takesue, H.; Tokura, Y.; Imoto, N. |
Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode |
2010 |
Phys. C |
470 |
1534-1537 |
|
|
|
Ferrari, S.; Kovalyuk, V.; Hartmann, W.; Vetter, A.; Kahl, O.; Lee, C.; Korneev, A.; Rockstuhl, C.; Gol'tsman, G.; Pernice, W. |
Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors |
2017 |
Opt. Express |
25 |
8739-8750 |
|
|
|
Минаева, Ольга Вячеславовна |
Быстродействующий однофотонный детектор на основе тонкой сверхпроводниковой пленки NbN |
2009 |
М. МПГУ |
|
|
|
|
|
Stucki, Damien; Barreiro, Claudio; Fasel, Sylvain; Gautier, Jean-Daniel; Gay, Olivier; Gisin, Nicolas; Thew, Rob; Thoma, Yann; Trinkler, Patrick; Vannel, Fabien; Zbinden, Hugo |
Continuous high speed coherent one-way quantum key distribution |
2009 |
Optics Express |
17 |
13326-13334 |
|
