| Author |
Title |
Year |
Publication |
Volume  |
Pages |
| Morozov, P.; Lukina, M.; Shirmanova, M.; Divochiy, A.; Dudenkova, V.; Gol'tsman, G. N.; Becker, W.; Shcheslavskiy, V. I. |
Singlet oxygen phosphorescence imaging by superconducting single-photon detector and time-correlated single-photon counting |
2021 |
Opt. Lett. |
46 |
1217-1220 |
| Słysz, W.; Węgrzecki, M.; Bar, J.; Grabiec, P.; Gol'tsman, G. N.; Verevkin, A.; Sobolewski, R. |
NbN superconducting single-photon detector coupled with a communication fiber |
2005 |
Elektronika : konstrukcje, technologie, zastosowania |
46 |
51-52 |
| Florya, I. N.; Korneeva, Y. P.; Mikhailov, M. Y.; Devizenko, A. Y.; Korneev, A. A.; Goltsman, G. N. |
Photon counting statistics of superconducting single-photon detectors made of a three-layer WSi film |
2018 |
Low Temp. Phys. |
44 |
221-225 |
| Milostnaya, I.; Korneev, A.; Rubtsova, I.; Seleznev, V.; Minaeva, O.; Chulkova, G.; Okunev, O.; Voronov, B.; Smirnov, K.; Gol'tsman, G.; Slysz, W.; Wegrzecki, M.; Guziewicz, M.; Bar, J.; Gorska, M.; Pearlman, A.; Kitaygorsky, J.; Cross, A.; Sobolewski, R. |
Superconducting single-photon detectors designed for operation at 1.55-µm telecommunication wavelength |
2006 |
J. Phys.: Conf. Ser. |
43 |
1334-1337 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
