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Author Title Year (up) Publication Volume Pages
Il'in, K. S.; Gol'tsman, G. N.; Voronov, B. M.; Sobolewski, Roman Characterization of the electron energy relaxation process in NbN hot-electron devices 1999 Proc. 10th Int. Symp. Space Terahertz Technol. 390-397
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358
Verevkin, A.; Williams, C.; Gol’tsman, G. N.; Sobolewski, R.; Gilbert, G. Single-photon superconducting detectors for practical high-speed quantum cryptography 2001 OFCC/ICQI Pa3
Gol’tsman, G.; Okunev, O.; Chulkova, G.; Lipatov, A.; Dzardanov, A.; Smirnov, K.; Semenov, A.; Voronov, B.; Williams, C.; Sobolewski, R. Fabrication and properties of an ultrafast NbN hot-electron single-photon detector 2001 IEEE Trans. Appl. Supercond. 11 574-577
Verevkin, A.; Xu, Y.; Zheng, X.; Williams, C.; Sobolewski, Roman; Okunev, O.; Smirnov, K.; Chulkova, G.; Korneev, A.; Lipatov, A.; Gol’tsman, G. N. Superconducting NbN-based ultrafast hot-electron single-photon detector for infrared range 2001 Proc. 12th Int. Symp. Space Terahertz Technol. 462-468