| Author |
Title |
Year |
Publication  |
Volume |
Pages |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Miller, Aaron J.; Lita, Adriana E.; Calkins, Brice; Vayshenker, Igor; Gruber, Steven M.; Nam, Sae Woo |
Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent |
2011 |
Optics Express |
19 |
9102-9110 |
| Steudle, Gesine A.; Schietinger, Stefan; Höckel, David; Dorenbos, Sander N.; Zadeh, Iman E.; Zwiller, Valery; Benson, Oliver |
Measuring the quantum nature of light with a single source and a single detector |
2012 |
Phys. Rev. A |
86 |
053814 |
| Gershenzon, E. M.; Goltsman, G. N.; Orlov, L. |
Investigation of population and ionization of donor excited states in Ge |
1976 |
Physics of Semiconductors |
|
631-634 |
| Gorokhov, G.; Bychanok, D.; Gayduchenko, I.; Rogov, Y.; Zhukova, E.; Zhukov, S.; Kadyrov, L.; Fedorov, G.; Ivanov, E.; Kotsilkova, R.; Macutkevic, J.; Kuzhir, P. |
THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites |
2020 |
Polymers (Basel) |
12 |
3037 (1 to 14) |
