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Author Title Year Publication Volume Pages (down)
Floet D. W.; Gao J. R.; Klapwijk T. M.; de Korte P. A. J. Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers 2000 Appl. Phys. Lett. 77 1719
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358
Gerecht, E.; Musante, C.F.; Zhuang, Y.; Ji, M.; Yngvesson, K.S.; Goyette, T.; Waldman, J. NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit 2000 Proc. IMS 2 1007-1010
Kawamura, Jonathan; Blundell, Raymond; Tong, C.-Y. Edward; Papa, D. Cosmo; Hunter, Todd R.; Paine, Scot.t. N.; Patt, Ferdinand; Gol'tsman, Gregory; Cherednichenko, Sergei; Voronov, Boris; Gershenzon, Eugene Superconductive hot-electron bolometer mixer receiver for 800 GHz operation 2000 IEEE Trans. Microwave Theory and Techniques 48 683-689
Kawamura, J.; Blundell, R.; Tong, C.-Y. E.; Papa, D. C.; Hunter, T. R.; Paine, S. N.; Patt, F.; Gol'tsman, G.; Cherednichenko, S.; Voronov, B.; Gershenzon, E. Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation 2000 IEEE Trans. Microw. Theory Techn. 48 683-689