| |
Author |
Title  |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Gerecht, E.; Musante, C.F.; Zhuang, Y.; Ji, M.; Yngvesson, K.S.; Goyette, T.; Waldman, J. |
NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit |
2000 |
Proc. IMS |
2 |
1007-1010 |
|
|
|
Huebers, H.-W.; Semenov, A.; Schubert, J.; Gol’tsman, G. N.; Voronov, B. M.; Gershenzon, E. M.; Krabbe, A.; Roeser, H.-P. |
NbN hot-electron bolometer as THz mixer for SOFIA |
2000 |
Proc. SPIE |
4014 |
195-202 |
|
|
|
Semenov, A. D.; Gol’tsman, G. N. |
Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector |
2000 |
J. Appl. Phys. |
87 |
502-510 |
|
|
|
Hübers, Heinz-Wilhelm; Semenov, Alexei; Schubert, Josef; Gol'tsman, Gregory; Voronov, Boris; Gershenzon, Evgeni |
Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz |
2000 |
Proc. 8-th Int. Conf. on Terahertz Electronics |
|
117-119 |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
