| Author |
Title |
Year |
Publication |
Volume  |
Pages |
| Kawamura, J.; Blundell, R.; Tong, C.-Y. E.; Papa, D. C.; Hunter, T. R.; Paine, S. N.; Patt, F.; Gol'tsman, G.; Cherednichenko, S.; Voronov, B.; Gershenzon, E. |
Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation |
2000 |
IEEE Trans. Microw. Theory Techn. |
48 |
683-689 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Gundlach, K. H.; Schicke, M. |
SIS and bolometer mixers for terahertz frequencies |
2000 |
Supercond. Sci. Technol |
13 |
181-187 |
| Gerecht, E.; Musante, C.F.; Zhuang, Y.; Ji, M.; Yngvesson, K.S.; Goyette, T.; Waldman, J. |
NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit |
2000 |
Proc. IMS |
2 |
1007-1010 |
| Tong, C.-Y. Edward; Kawamura, Jonathan; Todd, R. Hunter; Papa, D. Cosmo; Blundell, Raymond.; Smith, Michael; Patt, Ferdinand; Gol'tsman, Gregory; Gershenzon, Eugene |
Successful operation of a 1 THz NbN hot-electron bolometer receiver |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
49-59 |
