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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358 details   doi
Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. YBa2Cu3O7−δ hot-electron bolometer mixer 2000 Phys. C: Supercond. 341-348 2653-2654 details   doi
Hübers, Heinz-Wilhelm; Semenov, Alexei; Schubert, Josef; Gol'tsman, Gregory; Voronov, Boris; Gershenzon, Evgeni Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz 2000 Proc. 8-th Int. Conf. on Terahertz Electronics 117-119 details   url
Huebers, H.-W.; Semenov, A.; Schubert, J.; Gol’tsman, G. N.; Voronov, B. M.; Gershenzon, E. M.; Krabbe, A.; Roeser, H.-P. NbN hot-electron bolometer as THz mixer for SOFIA 2000 Proc. SPIE 4014 195-202 details   doi
Darula, Marian; Semenov, Alex D.; Hübers, Heinz-Wilhelm; Schubert, Josef Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies 2000 Proc. 11th Int. Symp. Space Terahertz Technol. 515 details   url
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