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Kovalyuk, V.; Kahl, O.; Ferrari, S.; Vetter, A.; Lewes-Malandrakis, G.; Nebel, C.; Korneev, A.; Goltsman, G.; Pernice, W. On-chip single-photon spectrometer for visible and infrared wavelength range 2018 J. Phys.: Conf. Ser. 1124 051045 details   doi
Zolotov, P. I.; Divochiy, A. V.; Vakhtomin, Y. B.; Lubenchenko, A. V.; Morozov, P. V.; Shurkaeva, I. V.; Smirnov, K. V. Influence of sputtering parameters on the main characteristics of ultra-thin vanadium nitride films 2018 J. Phys.: Conf. Ser. 1124 051030 details   doi
Romanov, N. R.; Zolotov, P. I.; Vakhtomin, Y. B.; Divochiy, A. V.; Smirnov, K. V. Electron diffusivity measurements of VN superconducting single-photon detectors 2018 J. Phys.: Conf. Ser. 1124 051032 details   doi
Matyushkin, Y. E.; Gayduchenko, I. A.; Moskotin, M. V.; Goltsman, G. N.; Fedorov, G. E.; Rybin, M. G.; Obraztsova, E. D. Graphene-layer and graphene-nanoribbon FETs as THz detectors 2018 J. Phys.: Conf. Ser. 1124 051054 details   doi
Moskotin, M. V.; Gayduchenko, I. A.; Goltsman, G. N.; Titova, N.; Voronov, B. M.; Fedorov, G. F.; Pyatkov, F.; Hennrich, F. Bolometric effect for detection of sub-THz radiation with devices based on carbon nanotubes 2018 J. Phys.: Conf. Ser. 1124 051050 (1 to 5) details   doi
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