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Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer 2000 Applied Physics Letters 77 4421-4424 details   openurl
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