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Author
Title
Year
Publication
Volume
Pages
Links
Manus, M. K. Mc
;
Kash, J. A.
;
Steen, S. E.
;
Polonsky, S.
;
Tsang, J.C.
;
Knebel, D. R.
;
Huott, W.
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
2000
Microelectronics Reliability
40
1353-1358
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