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\bibitem{Zhang_etal2003} Zhang J, Boiadjieva N, Chulkova G, Deslandes H, Gol{\textquoteright}tsman GN, Korneev A, et al. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. Electron Lett. 2003;39(14):1086--8.

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