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\bibitem{Gershenson_etal1983} Gershenson EM, Gol{\textquoteright}tsman GN, Elant{\textquoteright}ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908--13.

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