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\bibitem{Gershenson_etal1983} Gershenson, E. M., Gol{\textquoteright}tsman, G. N., Elant{\textquoteright}ev, A. I., Kagane, M. L., Multanovskii, V. V., \& Ptitsina, N. G. (1983). Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. \textit{Sov. Phys. Semicond.}, \textit{17}(8), 908--913.

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