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\bibitem{Zhang_etal2003} Zhang, J., Boiadjieva, N., Chulkova, G., Deslandes, H., Gol{\textquoteright}tsman, G. N., Korneev, A., et al. (2003). Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. \textit{Electron. Lett.}, \textit{39}(14), 1086--1088.

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