| |
Author  |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; Leduc, H. G. |
Spectrum of thermal fluctuation noise in diffusion and phonon cooled hot-electron mixers |
1998 |
Applied Physics Letters |
72 |
1516-1518 |
|
|
|
Galeazzi, Massimiliano |
Fundamental noise processes in TES devices |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
267-271 |
|
|
|
Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
2000 |
Applied Physics Letters |
77 |
4421-4424 |
|
|
|
Karasik, B. S.; Elantiev, A. I. |
Noise temperature limit of a superconducting hot-electron bolometer mixer |
1996 |
Applied Physics Letters |
68 |
853-855 |
|
