@Article{Manus_etal2000,
author="Manus, M. K. Mc
and Kash, J. A.
and Steen, S. E.
and Polonsky, S.
and Tsang, J. C.
and Knebel, D. R.
and Huott, W.",
title="PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis",
journal="Microelectronics Reliability",
year="2000",
volume="40",
pages="1353--1358",
optkeywords="SSPD; CMOS testing",
abstract="Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.",
optnote="exported from refbase (https://db.rplab.ru/refbase/show.php?record=1054), last updated on Sat, 17 Oct 2015 22:54:06 -0500",
doi="10.1016/S0026-2714(00)00137-2",
opturl="https://doi.org/10.1016/S0026-2714(00)00137-2"
}