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\bibitem{Manus_etal2000} Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. \textit{Microelectronics Reliability}, \textit{40}, 1353--1358.

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