@InProceedings{Stellari+Song2005,
author="Stellari, Franco
and Song, Peilin",
title="Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD)",
booktitle="Proc. 12$^{th}$ IPFA",
year="2005",
publisher="IEEE",
pages="2",
optkeywords="SSPD; CMOS testing",
abstract="In F. Stellari and P. Song (2004) the authors have shown a comparison among different detectors used for diagnosing integrated circuits (ICs) by means of the PICA method. In their experiments they used two versions of the SSPD detector (p-SSPD is a prototype version, while c-SSPD is the first commercially available generation of the detector as presented in W. K. Lo et al. (2002), as well as the imaging detector (S-25 photo-multiplier tube (PMT) as discussed in W. G. McMullan (1987)) used in the conventional PICA technique. A microprocessor chip fabricated in a 0.13 $\mu$m 1.2 V technology is used to show that c-SSPD provides a significant reduction in acquisition time for the collection of optical waveforms from chips running at very low. In this paper, the authors summarize the main results.",
optnote="exported from refbase (https://db.rplab.ru/refbase/show.php?record=1055), last updated on Sat, 17 Oct 2015 23:23:32 -0500",
isbn="0-7803-9301-5",
doi="10.1109/IPFA.2005.1469119",
opturl="https://doi.org/10.1109/IPFA.2005.1469119"
}