%0 Conference Proceedings
%T Large bandwidth of NbN phonon-cooled hot-electron bolometer mixers
%A Cherednichenko, S.
%A Yagoubov, P.
%A Il'in, K.
%A Gol'tsman, G.
%A Gershenzon, E.
%S Proc. 27th Eur. Microwave Conf.
%D 1997
%V 2
%I IEEE
%F Cherednichenko_etal1997
%O exported from refbase (https://db.rplab.ru/refbase/show.php?record=1075), last updated on Sat, 30 Apr 2016 06:27:17 -0500
%X The bandwidth of NbN phonon-cooled hot electron bolometer mixers has been systematically investigated with respect to the film thickness and film quality variation. The films, 2.5 to 10 nm thick, were fabricated on sapphire substrates using DC reactive magnetron sputtering. All devices consisted of several parallel strips, each 1 um wide and 2 um long, placed between Ti-Au contact pads. To measure the gain bandwidth we used two identical BWOs operating in the 120-140 GHz frequency range, one functioning as a local oscillator and the other as a signal source. The majority of the measurements were made at an ambient temperature of 4.2 K with optimal LO and DC bias. The maximum 3 dB bandwidth (about 4 GHz) was achieved for the devices made of films which were 2.5-3.5 nm thick, had a high critical temperature, and high critical current density. A theoretical analysis of bandwidth for these mixers based on the two-temperature model gives a good description of the experimental results if one assumes that the electron temperature is equal to the critical temperature.
%K HEB mixer
%K fabrication process
%R 10.1109/EUMA.1997.337922
%U https://doi.org/10.1109/EUMA.1997.337922
%P 972-977