TY  - JOUR
AU  - Saveskul, N. A.
AU  - Titova, N. A.
AU  - Baeva, E. M.
AU  - Semenov, A. V.
AU  - Lubenchenko, A. V.
AU  - Saha, S.
AU  - Reddy, H.
AU  - Bogdanov, S. I.
AU  - Marinero, E. E.
AU  - Shalaev, V. M.
AU  - Boltasseva, A.
AU  - Khrapai, V. S.
AU  - Kardakova, A. I.
AU  - Goltsman, G. N.
PY  - 2019
DA  - 2019//
TI  - Superconductivity behavior in epitaxial TiN films points to surface magnetic disorder
T2  - Phys. Rev. Applied
JO  - Phys. Rev. Applied
SP  - 054001
VL  - 12
IS  - 5
KW  - epitaxial TiN films
AB  - We analyze the evolution of the normal and superconducting properties of epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe an increase of the residual resistivity, that becomes dominated by diffusive surface scattering for d≤20nm. At the same time, a substantial thickness-dependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such high-quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of approximately 1012cm−2. Our results suggest that surface magnetic disorder is generally present in oxidized TiN films.
SN  - 2331-7019
UR  - https://link.aps.org/doi/10.1103/PhysRevApplied.12.054001
UR  - https://doi.org/10.1103/PhysRevApplied.12.054001
DO  - 10.1103/PhysRevApplied.12.054001
N1  - exported from refbase (https://db.rplab.ru/refbase/show.php?record=1166), last updated on Fri, 30 Apr 2021 22:21:18 -0500
ID  - Saveskul_etal2019
ER  -