TY  - CONF
AU  - Romanov, N. R.
AU  - Zolotov, P. I.
AU  - Vakhtomin, Y. B.
AU  - Divochiy, A. V.
AU  - Smirnov, K. V.
PY  - 2018
DA  - 2018//
TI  - Electron diffusivity measurements of VN superconducting single-photon detectors
T2  - J. Phys.: Conf. Ser.
BT  - J. Phys.: Conf. Ser.
SP  - 051032
VL  - 1124
KW  - SSPD
KW  - SNSPD
KW  - VN
AB  - The research of ultrathin vanadium nitride (VN) films as a promising candidate for superconducting single-photon detectors (SSPD) is presented. The electron diffusivity measurements are performed for such devices. Devices that were fabricated out from 9.9 nm films had diffusivity coefficient of 0.41 cm2/s and from 5.4 nm – 0.54 cm2/s. Obtained values are similar to other typical SSPD materials. The diffusivity that increases along with decreasing of the film thickness is expected to allow fabrication of the devices with improved characteristics. Fabricated VN SSPDs showed prominent single-photon response in the range 0.9-1.55 µm.
SN  - 1742-6588
UR  - https://iopscience.iop.org/article/10.1088/1742-6596/1124/5/051032
UR  - https://doi.org/10.1088/1742-6596/1124/5/051032
DO  - 10.1088/1742-6596/1124/5/051032
N1  - exported from refbase (https://db.rplab.ru/refbase/show.php?record=1229), last updated on Mon, 03 May 2021 23:09:49 -0500
ID  - Romanov_etal2018
ER  -