PT Journal
AU Gousev, YP
   Semenov, AD
   Goghidze, IG
   Pechen, EV
   Varlashkin, AV
   Gol'tsman, GN
   Gershenzon, EM
   Renk, KF
TI Current dependent noise in a YBa[sub:2]Cu[sub:3]O[sub:7-δ] hot-electron bolometer
SO IEEE Trans. Appl. Supercond.
JI IEEE Trans. Appl. Supercond.
PY 1997
BP 3556
EP 3559
VL 7
IS 2
DI 10.1109/77.622166
DE YBCO HTS HEB mixers
AB We investigated the output noise of a YBa[sub:2]Cu[sub:3]O[sub:7-δ] (YBCO) superconducting hot-electron bolometer (HEB) in a large frequency range (10 kHz to 8 GHz); the bolometer either consisted of a structured 50 nm thick YBCO film on LaAlO/sub 3/ or a 30 nm thick film on a MgO substrate. We found that flicker noise dominated at low frequencies (below 1 MHz), while at higher frequencies Johnson noise and a current dependent noise were the main noise sources.
ER