@InProceedings{Kawamura_etal1995,
author="Kawamura, J.
and Blundell, R.
and Tong, C-Y E.
and Gol{\textquoteright}tsman, G.
and Gershenzon, E.
and Voronov, B.",
title="NbN hot-electron mixer measurements at 200 GHz",
booktitle="Proc. 6$^{th}$ Int. Symp. Space Terahertz Technol.",
year="1995",
pages="254--261",
optkeywords="NbN HEB mixers",
abstract="We present noise and gain measurements of resistively driven NbN hot-electron mixers near 200 GHz. The device geometry is chosen so that the dominant cooling process of the hot-electrons is their interaction with the lattice. Except for a single batch, the intermediate frequency cut-off of these mixer elements is - 3 700 MHz, and has shown little variation among other batches of devices. At 100 MHz we measured intrinsic mixer losses as low as ---3 dB. We measured the noise temperatures at several intermediate frequencies, and for the best de- vice at 137 MHz with 20 MHz bandwidth, we measured 2000 K; using a low-noise first- stage amplifier at 1.5 GHz with 200 MHz bandwidth, the receiver noise temperature measured 2800 K. We estimate that the noise contribution from the mixer is 500 K and the total losses are ---15 dB at 137 MHz.",
optnote="exported from refbase (https://db.rplab.ru/refbase/show.php?record=1626), last updated on Wed, 26 May 2021 16:59:15 -0500",
opturl="https://www.nrao.edu/meetings/isstt/1995.shtml"
}