%0 Conference Proceedings
%T NbN hot-electron mixer measurements at 200 GHz
%A Kawamura, J.
%A Blundell, R.
%A Tong, C-Y E.
%A Gol'tsman, G.
%A Gershenzon, E.
%A Voronov, B.
%S Proc. 6[super:th] Int. Symp. Space Terahertz Technol.
%D 1995
%F Kawamura_etal1995
%O exported from refbase (https://db.rplab.ru/refbase/show.php?record=1626), last updated on Wed, 26 May 2021 16:59:15 -0500
%X We present noise and gain measurements of resistively driven NbN hot-electron mixers near 200 GHz. The device geometry is chosen so that the dominant cooling process of the hot-electrons is their interaction with the lattice. Except for a single batch, the intermediate frequency cut-off of these mixer elements is - 3 700 MHz, and has shown little variation among other batches of devices. At 100 MHz we measured intrinsic mixer losses as low as —3 dB. We measured the noise temperatures at several intermediate frequencies, and for the best de- vice at 137 MHz with 20 MHz bandwidth, we measured 2000 K; using a low-noise first- stage amplifier at 1.5 GHz with 200 MHz bandwidth, the receiver noise temperature measured 2800 K. We estimate that the noise contribution from the mixer is 500 K and the total losses are —15 dB at 137 MHz.
%K NbN HEB mixers
%U https://www.nrao.edu/meetings/isstt/1995.shtml
%P 254-261