@Article{Gershenson_etal1983,
author="Gershenson, E. M.
and Gol{\textquoteright}tsman, G. N.
and Elant{\textquoteright}ev, A. I.
and Kagane, M. L.
and Multanovskii, V. V.
and Ptitsina, N. G.",
title="Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors",
journal="Sov. Phys. Semicond.",
year="1983",
volume="17",
number="8",
pages="908--913",
optkeywords="BWO spectroscopy; pure semiconductors; residual impurities",
optnote="Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках",
optnote="exported from refbase (https://db.rplab.ru/refbase/show.php?record=1714), last updated on Fri, 28 May 2021 23:11:04 -0500",
opturl="https://scholar.google.com/scholar?cluster=10840583430299553394&hl=en&oi=scholarr"
}