PT Journal
AU Gershenson, EM
   Gol'tsman, GN
   Elant'ev, AI
   Kagane, ML
   Multanovskii, VV
   Ptitsina, NG
TI Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors
SO Sov. Phys. Semicond.
JI Sov. Phys. Semicond.
PY 1983
BP 908
EP 913
VL 17
IS 8
DE BWO spectroscopy; pure semiconductors; residual impurities
ER