@Article{Bennett_etal2014,
author="Bennett, Douglas A.
and Schmidt, Daniel R.
and Swetz, Daniel S.
and Ullom, Joel N.",
title="Phase-slip lines as a resistance mechanism in transition-edge sensors",
journal="Appl. Phys. Lett.",
year="2014",
volume="104",
pages="042602",
optkeywords="microbolometers; TES; phase-slip lines; PSL",
abstract="The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model{\textquoteright}s predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.",
optnote="Recommended by Klapwijk",
optnote="exported from refbase (https://db.rplab.ru/refbase/show.php?record=929), last updated on Mon, 30 Jun 2014 11:04:07 -0500",
doi="10.1063/1.4863664",
opturl="https://doi.org/10.1063/1.4863664"
}